Electron Emission from Inconel under Ion Bombardment
نویسندگان
چکیده
Electron yields from clean and oxydized Inconel 625 surfaces have been measured for H', H:, Hef, 0' and Ar+ ions at normal incidence in the energy range 1.5-40 keV. These measurements have been made under ultrahigh vacuum and the samples were freed of surface contaminants by bombarding with high doses of either 20 keV H l or 30 keV Ar+ ions. Differences in yields of oxydized versus clean surfaces are explained in terms of differences in the probability that electrons internally excited escape upon reaching the surface.
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